Digital Instruments Dimension 3100 AFM

  • August 3rd, 2010
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The Digital Instruments Dimension 3100  is an atomic force microscope (AFM). It is equipped with a Nanoscope IV controller. The instrument is capable of performing AFM measurements probing the sample topography in contact or tapping mode, as well as acquiring force curves for investigating the sample’s elastic properties. It can also be used for magnetic force microscopy (MFM).

Current location: Bevill 1051.


Closed Loop XY Head

  • XY: 90 μm x 90 μm, Z: ~6 μm
  • Z Voltage Noise 0.05 nm RMS
  • XY Flatness 60 nm over 90 μm

Contact / Non-contact AFM, MFM

Typical scan rates: 0.5 Hz – 2 Hz (Tapping Mode), 1 Hz – 4 Hz (Contact Mode)