Philips X-Ray Diffraction

  • August 3rd, 2010
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The Philips X’Pert MRP can be used for X-ray diffraction (XRD) and X-ray reflection (XRR) measurements. The installed options make it especially suitable for thin films. It is equipped with a Cu anode and a goniometer with cradle, allowing angular movements in 2Theta, Omega, Phi, and Psi, as well as linear positioning in x,y, and z. Line focus and point focus setups are available.

Current location: Bevill 2058.